The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2023
Filed:
May. 01, 2021
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Jeffrey Wilson, Franklin, MA (US);
Mordechai Grutman, Newton, MA (US);
Dell Products, L.P., Hopkinton, MA (US);
Abstract
A model of an algorithm to be tested is created based on the steps that the algorithm uses to implement a particular function. The model is used by an algorithm verification process to control execution of the application under test. Stubs (small pieces of code) are inserted into the application under test which are used to control execution of the algorithm to determine the result of execution of the algorithm at various locations. The remote stubs enable the testing framework to control execution of the application, stop execution of the application, view data structures associated with the application, freeze system behavior, induce multi-layered dependent sequences, analyze logs, change system flow based on test requests, examine internal data structures as part of the tests, and verify that each method and the combined results of the methods are as expected, based on the original definition of the application algorithm.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile