The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Dec. 19, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Thomas Strach, Wildberg, DE;

Preetham M. Lobo, Bangalore, IN;

Tobias Webel, Schwaebisch-Gmuend, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/3206 (2019.01); G06F 1/3287 (2019.01); H02H 1/06 (2006.01); H02H 3/247 (2006.01); G01R 19/165 (2006.01);
U.S. Cl.
CPC ...
G06F 1/3206 (2013.01); G01R 19/165 (2013.01); G06F 1/3287 (2013.01); H02H 1/06 (2013.01); H02H 3/247 (2013.01);
Abstract

Embodiments of the present disclosure relate to managing power provided to a semiconductor circuit to prevent undervoltage conditions. A measured voltage value describing a measured supply voltage at a first subcircuit of a semiconductor circuit can be received, the measured voltage value having a first resolution. A selected metric indicative of a supply voltage present at the first subcircuit can be received, the selected metric having a second resolution higher than the first resolution. The selected metric is calibrated to obtain a calibrated metric when a transition of the measured voltage value occurs.


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