The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Jul. 10, 2019
Applicant:

Siemens Industry Software NV, Leuven, BE;

Inventor:

Nicolas Lammens, Kessel-Lo, BE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); B33Y 50/00 (2015.01); G06N 20/00 (2019.01); G05B 19/4099 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 13/027 (2013.01); B33Y 50/00 (2014.12); G05B 19/4099 (2013.01); G05B 23/0243 (2013.01); G05B 23/0254 (2013.01); G05B 23/0283 (2013.01); G06N 20/00 (2019.01); G05B 2219/49007 (2013.01);
Abstract

A method and a system for fatigue life prediction of additive manufactured components accounting for localized material properties. The method and the system is employed for prediction of fatigue life properties of an additive manufactured element, with a data collection step in which several data points for maximum stress vs. cycles to failure for different given processing steps of the element are collected, with a training step in which a Machine Learning system is trained with the collected data, and with an evaluation step in which the trained Machine Learning system is confronted with actual processing steps and used to predict the fatigue life properties of the element.


Find Patent Forward Citations

Lammens, Nicolas. (2023). Machine learning approach for fatigue life prediction of additive manufactured components accounting for localized material properties (U.S. Patent No. 11586161). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11586161

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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