The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Dec. 04, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Jitendra Singh, Noida, IN;

Mukul Tewari, Lafayette, CO (US);

Vinayak Sastri, Bangalore, IN;

Seema Nagar, Bangalore, IN;

Kuntal Dey, Vasant Kunj, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01W 1/00 (2006.01); G01W 1/10 (2006.01); B64C 39/02 (2023.01); G05D 1/00 (2006.01);
U.S. Cl.
CPC ...
G01W 1/10 (2013.01); B64C 39/024 (2013.01); G05D 1/0027 (2013.01); G05D 1/0088 (2013.01); B64C 2201/127 (2013.01); G05D 2201/0201 (2013.01);
Abstract

A computer-implemented method for effective agriculture and environment monitoring. The method may comprise measuring a desired variable over an area of interest using a remote inspection platform according to an inspection plan, predicting an occlusion of the remote inspection platform, and in response to the predicted occlusion, determining whether to invoke a local inspection platform to complete the inspection plan. The occlusion in some embodiments interrupts the inspection plan for the remote inspection platform.


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