The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2023
Filed:
Aug. 13, 2021
Applicant:
Allegro Microsystems, Llc, Manchester, NH (US);
Inventors:
Adam Lee, Portland, OR (US);
Andrew S. Huntington, Banks, OR (US);
Charles Myers, Portland, OR (US);
Shunming Sun, Colorado Springs, CO (US);
Assignee:
Allegro MicroSystems, LLC, Manchester, NH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 7/497 (2006.01); G01S 17/894 (2020.01); G01S 7/4863 (2020.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 7/4863 (2013.01); G01S 17/894 (2020.01);
Abstract
Methods and apparatus for nonuniformity correction (NUC) for a sensor having an avalanche photodiode (APD) array and an integrated circuit. The sensor can include anode bias control module, a passive mode module, and an active mode module. DC photocurrent from the APD array can be measured and used for controlling an anode reverse bias voltage to each element in the APD to achieve a nonuniformity correction level less than a selected threshold.