The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Oct. 25, 2018
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Nobuyuki Nishita, Tokyo, JP;

Yasushi Tanaka, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G01S 17/42 (2006.01); G01C 15/06 (2006.01); G01C 15/00 (2006.01);
U.S. Cl.
CPC ...
G01S 7/481 (2013.01); G01C 15/002 (2013.01); G01C 15/06 (2013.01); G01S 17/42 (2013.01);
Abstract

In measurement with a surveying device having a surveying function and a laser scanner function, three-dimensional coordinates of a reflecting prism acquired with the surveying function and three-dimensional coordinates of a vertex of a polyhedron generated by processing point group data acquired with the laser scanner function are made to coincide with each other. The reflecting prism is used together with the surveying device having the surveying function and the laser scanner function, is provided to a measurement target object, and is disposed in such a position that the vertex position of the measurement target object coincides with or is considered to coincide with the optical center position of the prism.


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