The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Jun. 02, 2021
Applicant:

Dell Products L.p., Round Rock, TX (US);

Inventors:

Umesh Chandra, Santa Cruz, CA (US);

Bhyrav Mutnury, Round Rock, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/58 (2020.01);
U.S. Cl.
CPC ...
G01R 31/58 (2020.01);
Abstract

A high-speed signal subsystem testing system tests a processor transmitter and receiver coupled to a connector via a transmitter trace and a receiver trace, respectively. A transmitter test circuit on a testing board coupled to the connector compares a transmitter voltage received from the transmitter via the transmitter trace and the connector to a common mode voltage range and, in response to the transmitter voltage being outside the common mode voltage range, provides a transmitter trace issue signal. A receiver test circuit on the testing board coupled to the connector transmits a first test voltage towards the receiver, compares a second test voltage detected at the receiver test circuit in response to transmitting the first test voltage towards the receiver to a reference test voltage and, in response to the second test voltage being above the reference test voltage, provides a receiver trace issue signal.


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