The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Nov. 19, 2021
Applicant:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Inventor:

Yuan-Yu Jau, Albuquerque, NM (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0885 (2013.01); G01R 29/0892 (2013.01);
Abstract

In a method of atomic electrometry, EIT spectroscopy is performed on host atoms of an alkali metal in a vapor cell. The EIT spectroscopy indicates a resonant energy of a probed Rydberg state of the host atoms. The vapor cell is exposed to an ambient electric field. A shift in the resonant energy as indicated by the EIT spectroscopy is observed and interpreted as a measurement of the ambient field. During the measurement of the ambient field, a bias electric field is generated inside the vapor cell by shining light into the vapor cell from a light source situated outside of the cell. The bias field is useful for increasing the sensitivity of the measurement.


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