The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Sep. 03, 2020
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Thomas G. Lavedas, Moneta, VA (US);

David G. Penn, Centreville, VA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 27/26 (2006.01); H03F 3/24 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2676 (2013.01); G01R 27/2641 (2013.01); H03F 3/245 (2013.01); H03F 2200/451 (2013.01);
Abstract

An apparatus includes a near-field probe having loops or coils of electrically-conductive material, where the near-field probe is configured to generate a magnetic field. The apparatus also includes a power amplifier configured to drive the near-field probe. The apparatus further includes a shunt capacitance coupled in parallel across the loops or coils of the near-field probe. The shunt capacitance and an inductance of the loops or coils of the near-field probe form part of a resistive-inductive-capacitive (RLC) network. The RLC network is configured to transform a smaller resistance of the near-field probe into a larger resistance. In some cases, the apparatus may include multiple near-field probes coupled in series, and the power amplifier may be configured to drive the multiple near-field probes. For each near-field probe, the apparatus may include a shunt capacitance coupled in parallel across the loops or coils of the near-field probe.


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