The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Jan. 05, 2021
Applicants:

Inner Mongolia University of Technology, Hohhot, CN;

Shandong University, Shandong, CN;

Inventors:

Ze Li, Hohhot, CN;

Jingshun Liu, Hohhot, CN;

Guanyu Cao, Hohhot, CN;

Rui Liu, Hohhot, CN;

Shuqin Xiao, Jinan, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01N 33/20 (2019.01); H01R 13/646 (2011.01); G06F 13/42 (2006.01);
U.S. Cl.
CPC ...
G01N 27/72 (2013.01); G01N 33/20 (2013.01); G06F 13/4282 (2013.01); H01R 13/646 (2013.01); G06F 2213/0002 (2013.01);
Abstract

The present disclosure provides a high-frequency magnetoimpedance testing apparatus and method. A testing platform in the apparatus is arranged within a Helmholtz coil and connected to a modulating electric current source and a high-frequency impedance analyzer, respectively; the Helmholtz coil is connected to a DC power source; a processor is connected to the high-frequency impedance analyzer and the DC power source separately; the testing platform includes a first double-sided copper-clad plate, and mode transition switches and connection terminals that are arranged on the first double-sided copper-clad plate; one end of the first double-sided copper-clad plate is connected to the high-frequency impedance analyzer, while the other end of the same is connected to a load; the mode transition switches are connected to the modulating electric current source. The present disclosure can realize in-situ current modulation of metallic fibers and high-frequency magnetoimpedance testing, and improve the testing accuracy.


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