The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Sep. 27, 2019
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Tatsuya Ikehara, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01); G01N 21/64 (2006.01); G01J 3/44 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/645 (2013.01); G01J 3/42 (2013.01); G01J 3/4406 (2013.01); G01N 21/65 (2013.01); G01N 2021/6417 (2013.01); G01N 2021/6463 (2013.01);
Abstract

A microspectroscopic device includes: a wavelength-tunable first light source configured to emit pump-light in a mid-infrared wavelength range; a second light source configured to emit probe-light in a visible range; a light source controller configured to change a wavelength of the infrared light source; a first optical system configured to combine the pump-light and the probe-light to acquired combined light and concentrate the combined light on a minute part of a sample; a second optical system configured to block at least the probe-light from transmitted light or reflected light of the sample; a detector configured to detect light incident thereon from the second optical system; a first spectrum acquisition means configured to acquire a spectrum of the incident light during the probe-light emission to the sample as a Raman spectrum or a fluorescence spectrum of the sample; and a second spectrum acquisition means configured to acquire an infrared absorption spectrum of the sample, based on a change in the spectrum of the incident light with respect to a change in a wavelength by the light source controller during the probe-light and pump-light emission to the sample.


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