The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Mar. 31, 2020
Applicant:

Toyota Research Institute, Inc., Los Altos, CA (US);

Inventors:

Alexander Alspach, Somerville, MA (US);

Naveen Suresh Kuppuswamy, Arlington, MA (US);

Avinash Uttamchandani, Cambridge, MA (US);

Assignee:

TOYOTA RESEARCH INSTITUTE, INC., Los Altos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 25/00 (2006.01); B25J 13/08 (2006.01); G01S 17/08 (2006.01);
U.S. Cl.
CPC ...
G01L 25/00 (2013.01); B25J 13/084 (2013.01); G01S 17/08 (2013.01);
Abstract

Devices, systems and methods for calibrating a deformable sensor are disclosed herein. A calibration device for calibrating a deformable sensor includes a frame, at least one actuator supported by the frame, where the at least one actuator comprises a drive mechanism operatively coupled to a probe portion, and an electronic control unit communicatively coupled to the drive mechanism of the at least one actuator. The electronic control unit is configured to cause the drive mechanism to move the probe portion a predetermined position to form a predetermined contact surface defined by an end of the probe portion of the actuator.


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