The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Jun. 26, 2020
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Kiminori Nakajima, Shiojiri, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60R 21/01 (2006.01); H03M 1/10 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
B60R 21/01 (2013.01); H03M 1/1076 (2013.01); H03M 1/12 (2013.01); B60R 2021/01184 (2013.01);
Abstract

A physical quantity detection circuit includes: a detection signal generation circuit generating a detection signal, based on an output signal from a physical quantity detection element; an analog/digital converter circuit converting the detection signal into a first digital signal and converting a test signal into a second digital signal; a test signal generation circuit generating the test signal; and a malfunction diagnosis circuit diagnosing a malfunction of the analog/digital converter circuit, based on the second digital signal. A full-scale voltage of the analog/digital converter circuit is selected from among a plurality of voltages having different magnitudes, according to a power supply voltage. The test signal includes an upper limit value test signal, a lower limit value test signal, and a first intermediate value test signal. The test signal generation circuit performs resistive voltage division of the full-scale voltage and thus generates the first intermediate value test signal.


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