The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Feb. 25, 2021
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hongmin Choi, Seoul, KR;
Haedong Yeon, Hwaseong-si, KR;
Junse Lee, Seoul, KR;
Heesang Noh, Suwon-si, KR;
Changhyun Baek, Yongin-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A method is provided. The method includes estimating adjacent channel leakage ratios respectively corresponding based on a test output signal output from a power amplifier according to a test input signal corresponding to a plurality of frequencies; selecting a test delay value corresponding to a largest value among the estimated adjacent channel leakage ratios; and providing a supply voltage to the power amplifier based on an envelope signal delayed according to the selected test delay value. For each of the plurality of test delay values, a corresponding adjacent channel leakage ratio is estimated based on a ratio of a magnitude of a component included in the test output signal and a magnitude of an inter-modulated component.