The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Jun. 17, 2021
Applicant:

Intellian Technologies, Inc., Pyeongtaek-si, KR;

Inventors:

Peter Hou, Gaithersburg, MD (US);

Xing-Xiang Liu, Rockville, MD (US);

Bingqian Lu, Olney, MD (US);

Ling Shen, Rockville, MD (US);

Jogender Nagar, Montgomery Village, MD (US);

Christopher Merola, Kirkland, WA (US);

Assignee:

INTELLIAN TECHNOLOGIES, INC., Pyeongtaek-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/12 (2015.01); G01R 29/10 (2006.01); H01Q 3/26 (2006.01);
U.S. Cl.
CPC ...
H04B 17/12 (2015.01); G01R 29/105 (2013.01); H01Q 3/267 (2013.01);
Abstract

Testing apparatuses, and methods for using such apparatuses to calibrate and test an antenna, include a chamber that includes a lining, the lining being made from a material that is absorptive to radiation at a test wavelength. An adjustable platform is positioned at a first side of the chamber, the adjustable platform being rotatable to change an orientation of a device under test. A probe is positioned at a second side of the chamber, opposite to the first side of the chamber, that measures electromagnetic radiation from the device under test. A vector network analyzer communicates with the device under test and the probe to determine calibration information for the device under test.


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