The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Dec. 22, 2020
Applicant:

Magik Eye Inc., New York, NY (US);

Inventor:

Akiteru Kimura, Hachioji, JP;

Assignee:

Magik Eye Inc., New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G01C 3/08 (2006.01); G06V 20/58 (2022.01); G06V 40/20 (2022.01); G06V 40/16 (2022.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G01C 3/08 (2013.01); G06V 20/58 (2022.01); G06V 40/161 (2022.01); G06V 40/28 (2022.01); G06T 2207/30201 (2013.01);
Abstract

An example method includes causing a light projecting system of a distance sensor to project a three-dimensional pattern of light onto an object, wherein the three-dimensional pattern of light comprises a plurality of points of light that collectively forms the pattern, causing a light receiving system of the distance sensor to acquire an image of the three-dimensional pattern of light projected onto the object, causing the light receiving system to acquire a two-dimensional image of the object, detecting a feature point in the two-dimensional image of the object, identifying an interpolation area for the feature point, and computing three-dimensional coordinates for the feature point by interpolating using three-dimensional coordinates of two points of the plurality of points that are within the interpolation area.


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