The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Mar. 17, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Changhun Sung, Yongin-si, KR;

Deokhwan Kim, Pyeongtaek-si, KR;

Byungdeok Kim, Yongin-si, KR;

Taeui Kim, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/46 (2022.01); G06T 3/40 (2006.01); G06V 10/44 (2022.01);
U.S. Cl.
CPC ...
G06T 3/4038 (2013.01); G06V 10/443 (2022.01);
Abstract

Each input image from a plurality of input images is divided into a plurality of image tiles. A feature point map including a plurality of feature point tiles respectively corresponding to the plurality of image tiles is generated by extracting feature points included in each image tile of the plurality of image tiles. A descriptor map including a plurality of descriptor tiles respectively corresponding to the plurality of feature point tiles is generated by generating descriptors of feature points included in the feature point map. Mapping information containing matching relationships between feature points included in different input images of the plurality of input images is generated based on a plurality of descriptor maps respectively corresponding to the plurality of input images. Image merging performance may be enhanced by dividing the input image into the plurality of image tiles to increase distribution uniformity of the feature points.


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