The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Jan. 03, 2019
Applicant:

Oxford University Innovation Limited, Oxford, GB;

Inventors:

David Andrew Clifton, Oxfordshire, GB;

Glen Wright Colopy, Oxfordshire, GB;

Marco Andre Figueiredo Pimentel, Oxfordshire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06F 17/18 (2006.01); G06K 9/00 (2022.01); G06K 9/62 (2022.01); G16H 50/70 (2018.01); G06V 30/242 (2022.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); A61B 5/725 (2013.01); A61B 5/7275 (2013.01); G06F 17/18 (2013.01); G06K 9/00496 (2013.01); G06K 9/00563 (2013.01); G06K 9/6255 (2013.01); G06K 9/6284 (2013.01); G06V 30/242 (2022.01); G16H 50/70 (2018.01);
Abstract

System monitors and methods of monitoring a system are disclosed. In one arrangement a system monitor predicts a future state of a system. A data receiving unit receives system data representing a set of one or more measurements performed on the system. A first statistical model is fitted to the system data. The first statistical model is compared to each of a plurality of dictionary entries in a database. Each dictionary entry comprises a second statistical model. The second statistical model is of the same general class as the first statistical model and obtained by fitting the second statistical model to data representing a set of one or more previous measurements performed on a system of the same type as the system being monitored and having a known subsequent state. A prediction of a future state of the system being monitored is output based on the comparison. The first statistical model and the second statistical model are each a stochastic process or approximation to a stochastic process.


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