The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Jun. 30, 2020
Managing defects in a model training pipeline using synthetic data sets associated with defect types
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Shoou-Jiun Wang, Sammamish, WA (US);
Xing Zhang, Bothell, WA (US);
Eslam K. Abdelreheem, Sammamish, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
The disclosure herein describes managing defects in a model training pipeline. A synthetic data set is generated that is associated with a defect type and a lifecycle stage of the model training pipeline, and baseline performance metrics associated with the defect type are generated. Based on a code change to the pipeline, a test model is trained using the pipeline and the synthetic data set, and test performance metrics are collected based on the test model and associated with the defect type. Based on comparing the baseline performance metrics and the test performance metrics, a defect of a particular defect type is identified in the pipeline. An indicator of the defect is provided that includes the defect type and the lifecycle stage with which the synthetic data set is associated, whereby a defect correction process is enabled to remedy the defect based on the associated defect type and the lifecycle stage.