The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Jan. 22, 2019
Adobe Inc., San Jose, CA (US);
Deepak Pai, Santa Clara, CA (US);
Joshua Sweetkind-Singer, San Jose, CA (US);
Debraj Basu, Los Angeles, CA (US);
Adobe Inc., San Jose, CA (US);
Abstract
Methods, systems, and non-transitory computer readable storage media are disclosed for analyzing feature impact of a machine-learning model using prototypes across analytical spaces. For example, the disclosed system can identify features of data points used to generate outputs via a machine-learning model and then map the features to a feature space and the outputs to a label space. The disclosed system can then utilize an iterative process to determine prototypes from the data points based on distances between the data points in the feature space and the label space. Furthermore, the disclosed system can then use the prototypes to determine the impact of the features within the machine-learning model based on locally sensitive directions; region variability; or mean, range, and variance of features of the prototypes.