The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Mar. 17, 2017
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Takehiko Mizoguchi, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01); G06F 16/906 (2019.01); G06F 16/9035 (2019.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06F 16/906 (2019.01); G06F 16/9035 (2019.01);
Abstract
Provided is a factor analysis device capable of obtaining more useful knowledge relating to the degree of influence of pieces of data. A factor analysis device according to one embodiment of the present invention is provided with: a classification unit for classifying a type of data into a first group or a second group; and an influence degree calculation unit for calculating, as the degree of influence on target data, the degree of influence of the data of the type classified into the second group on the data of the first group type.