The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Dec. 26, 2019
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Erick David Santillán Perez, Leimen, DE;

David Kernert, Bruchsal, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 3/084 (2023.01); G06N 3/04 (2023.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06N 3/084 (2013.01); G06K 9/6256 (2013.01); G06K 9/6262 (2013.01); G06K 9/6268 (2013.01); G06N 3/04 (2013.01);
Abstract

Disclosed herein are system, method, and computer program product embodiments for adapting machine learning models for use in additional applications. For example, feature extraction models are readily available for use in applications such as image detection. These feature extraction models can be used to label inputs (such as images) in conjunction with other deep neural network models. However, in adapting the feature extraction models to these uses, it becomes problematic to improve the quality of their results on target data sets, as these feature extraction models are large and resistant to retraining. Approaches disclosed herein include a transfer layer for providing fast retraining of machine learning models.


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