The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Nov. 16, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Tal Tlusty Shapiro, Zichon Yaacov, IL;

Ami Abutbul, Kiryat Gat, IL;

Simona Rabinovici-Cohen, Haifa, IL;

Shaked Perek, Givatayim, IL;

Efrat Hexter, Beit Shemesh, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06K 9/62 (2022.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G16H 50/70 (2018.01); G16H 50/20 (2018.01); G06V 10/34 (2022.01); A61B 6/03 (2006.01); G16H 50/50 (2018.01); A61B 5/055 (2006.01); A61B 6/02 (2006.01);
U.S. Cl.
CPC ...
G06K 9/628 (2013.01); G06K 9/623 (2013.01); G06V 10/34 (2022.01); G16H 30/20 (2018.01); G16H 30/40 (2018.01); G16H 50/20 (2018.01); G16H 50/70 (2018.01); A61B 5/055 (2013.01); A61B 6/025 (2013.01); A61B 6/032 (2013.01); G06V 2201/03 (2022.01); G16H 50/50 (2018.01);
Abstract

An approach for improving determining a significant slice associated with a tumor from a volume of medical images is disclosed. The approach is based on the annotation of tumor range and the slice index in which the tumor appears to have the largest area. The approach infer a tumor growth classifier on sliding window of the volume slices and creates a discrete integral function out of the classifier predictions. The approach applies post processing on the discrete integral function which can include a smoothing function and a bias correction. The approach selects the slice index of maximum value from the post processing step.


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