The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Sep. 07, 2020
Applicant:

Nec Laboratories Europe Gmbh, Heidelberg, DE;

Inventors:

Bin Cheng, Sandhausen, DE;

Jonathan Fuerst, Heidelberg, DE;

Mauricio Fadel Argerich, Heidelberg, DE;

Masahiro Hayakawa, Nagoya, JP;

Atsushi Kitazawa, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06N 3/04 (2023.01);
U.S. Cl.
CPC ...
G06K 9/6256 (2013.01); G06K 9/6215 (2013.01); G06K 9/6264 (2013.01); G06N 3/0454 (2013.01);
Abstract

A method is for matching a set of first classes assigned to a first data set with a set of second classes assigned to a second data set. The method includes constructing, via a set of pre-processing functions, a plurality of alignment profiles such that at least one alignment profile is assigned to each of the first classes and each of the second classes. The method includes generating a comparison matrix for each group of the alignment profiles, such that each group includes at least one of the first classes and at least one of the second classes. The method includes training a first machine learning model, through supervised training, based on the generated comparison matrices and based on probabilistic labels generated by a second machine learning model.


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