The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Feb. 18, 2020
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventors:

Ion Matei, Sunnyvale, CA (US);

Saigopal Nelaturi, Mountain View, CA (US);

Johan de Kleer, Los Altos, CA (US);

Clinton Morris, Sunnyvale, CA (US);

Aleksandar B. Feldman, Santa Cruz, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/10 (2020.01);
Abstract

A target system is coupled to a diagnosis engine that uses a lumped parameter model of the system for diagnosis. A proximity search in is performed in a computer-aided design model of the system to find groups of components that may be affected by resistive or parasitic interactions between the individual components in the groups. The lumped parameter model is augmented by adding elements that emulate the resistive or parasitic interactions between the individual components in the groups. The augmented lumped model is used by the diagnosis engine to perform diagnosis on the system.


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