The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Nov. 22, 2019
Oracle International Corporation, Redwood Shores, CA (US);
Anastasios Antoniadis, Athens, GR;
Raghavendra Ramesh, Brisbane, AU;
Padmanabhan Krishnan, Brisbane, AU;
Nicholas John Allen, Westlake, AU;
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A method for detecting a defect may include extracting, from application code and using a framework support specification corresponding to a framework, a framework interaction between the application code and the framework. The framework interaction specifies an object used by the application code and managed by the framework. The method may further include performing, using the framework interaction, a dynamic analysis of the application code to obtain a heap snapshot, performing, using the heap snapshot and the framework interaction, a static analysis of the application code, and detecting, by the static analysis, the defect.