The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Oct. 18, 2021
Applicant:

Wuhan University, Hubei, CN;

Inventors:

Yigang He, Hubei, CN;

Chuankun Wang, Hubei, CN;

Weiwei Zhang, Hubei, CN;

Lie Li, Hubei, CN;

Assignee:

WUHAN UNIVERSITY, Hubei, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G05F 1/56 (2006.01); G05F 1/567 (2006.01); H02S 40/32 (2014.01); H02M 7/5387 (2007.01); H02M 1/32 (2007.01); G01R 31/00 (2006.01); G06F 119/08 (2020.01);
U.S. Cl.
CPC ...
G05F 1/567 (2013.01); G01R 31/003 (2013.01); G01R 31/26 (2013.01); H02M 1/327 (2021.05); H02M 7/5387 (2013.01); H02S 40/32 (2014.12); G06F 2119/08 (2020.01); Y02E 10/56 (2013.01);
Abstract

The invention discloses a method and a system for correction of the junction temperatures of an IGBT module in a photovoltaic inverter. The method includes: constructing an electrothermal coupling model of an IGBT model based on a photovoltaic inverter topology, a light radiation intensity, and an ambient temperature; selecting an IGBT collector-emitter on-state voltage drop as an aging parameter and designing an on-state voltage drop sampling circuit to ensure measurement accuracy; constructing an aging database for IGBT modules in different aging stages based on large current and small current injection methods; comparing a junction temperature value output by the electrothermal coupling model with the calibrated junction temperature value and calibrating an aging process coefficient of an electrothermal coupling model correction formula; comparing an IGBT aging monitoring value with the aging threshold to determine the aging process and selecting a corresponding aging process coefficient to ensure accuracy of junction temperature data.


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