The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Jan. 04, 2021
Here Global B.v., Eindhoven, NL;
Anirudh Viswanathan, Berkeley, CA (US);
HERE GLOBAL B.V., Eindhoven, NL;
Abstract
Described herein are methods of generating learning data to facilitate de-biasing the labeled location of an object of interest within an image. Methods may include: receiving sensor data, where the sensor data is a first image; determining reference corner locations of an object in the first image using image processing; generating observed corner locations of the object in the first image from the determined reference corner locations; generating a bias transformation based, at least in part, on a difference between the reference corner locations and the observed corner locations of the object in the first image; receiving sensor data from another image sensor of a second image; receiving observed corner locations of an object in the second image from a user; and applying the bias transformation to the observed corner locations of the object in the second image to generate de-biased corners for the object in the second image.