The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Aug. 29, 2019
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Timothy J. Talty, Beverly Hills, MI (US);

Keyvan Sayyah, Santa Monica, CA (US);

Michael Mulqueen, Malibu, CA (US);

Richard Kremer, Calabasas, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/00 (2006.01); G01S 17/42 (2006.01); G01S 7/486 (2020.01); G01S 7/48 (2006.01); G01S 7/484 (2006.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 17/42 (2013.01); G01S 7/4802 (2013.01); G01S 7/484 (2013.01); G01S 7/486 (2013.01); G01S 7/4808 (2013.01); G01S 17/931 (2020.01);
Abstract

A vehicle, Lidar system and method of detecting an object is disclosed. The Lidar system includes a photonic chip having a laser, an on-chip frequency shifter, a combiner and a first set of photodetectors. The laser generates a transmitted light beam and an associated local oscillator beam within the photonic chip. The on-chip frequency shifter shifts a frequency of the local oscillator beam. The combiner combines a reflected light beam with the frequency-shifted local oscillator beam, wherein the reflected light beam is a reflection of the transmitted light beam from the object to generate a first electronic signal at the first set of photodetectors. A processor obtains a first measurement of a parameter of the object from the first electronic signal. The vehicle includes a navigation system for navigating the vehicle with respect to the object using at least the first measurement of the parameter.


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