The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Oct. 11, 2018
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventor:

Kazuhide Namba, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/497 (2006.01); G01S 17/931 (2020.01); G01S 17/894 (2020.01); G01S 7/48 (2006.01); G02B 5/20 (2006.01); G01S 7/481 (2006.01); H04N 5/225 (2006.01); G06V 10/143 (2022.01); G06V 10/145 (2022.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 7/4813 (2013.01); G01S 7/4816 (2013.01); G01S 17/894 (2020.01); G01S 17/931 (2020.01); G02B 5/201 (2013.01); G02B 5/208 (2013.01); G06V 10/143 (2022.01); G06V 10/145 (2022.01); H04N 5/2256 (2013.01);
Abstract

It is intended to promote enhancement of performance of acquiring a depth image. A depth image acquiring apparatus includes a light emitting diode, a TOF sensor, and a filter. The light emitting diode irradiates modulated light toward a detection area becoming an area in which a depth image is to be acquired to detect a distance. The TOF sensor receives incident light into which the light irradiated from the light emitting diode is reflected by an object lying in the detection area to become, thereby outputting a signal used to produce the depth image. The filter passes more light having a wavelength in a predetermined pass bandwidth than light having a wavelength in a pass bandwidth other than the predetermined pass bandwidth of the light made incident toward the TOF sensor. In this case, at least one of the light emitting diode, the TOF sensor, or arrangement of the filter is controlled in accordance with a temperature of the light emitting diode or the TOF sensor. The present technique, for example, can be applied to a system for with international search report acquiring a depth image by using a TOF system.


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