The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Dec. 20, 2021
Fujifilm Healthcare Corporation, Chiba, JP;
Ryota Satoh, Chiba, JP;
Keisuke Nishio, Chiba, JP;
Yasuhiro Kamada, Chiba, JP;
Yoshitaka Sato, Chiba, JP;
Masahiro Takizawa, Chiba, JP;
Toru Shirai, Chiba, JP;
FUJIFILM Healthcare Corporation, Chiba, JP;
Abstract
To provide a technique in which, in imaging using an EPI method, an occurrence of an artifact when phase correction is performed for each channel is avoided and the phase correction is accurately performed. A common phase correction value to be applied to data of all channels is calculated using pre-scan data of each channel. The common phase correction value is obtained by combining a difference phase obtained for each of the channels. The difference phase is obtained by complex integration, while an absolute value of each channel is maintained as it is. The combination is performed by complex average, and averaging processing according to a weight of the absolute value is performed. The occurrence of an artifact can be prevented by using the common phase correction value, and robust phase correction can be performed by including the weight of the absolute value.