The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Nov. 13, 2018
Texas Tech University System, Lubbock, TX (US);
Brendan Kelly, Lubbock, TX (US);
Eric Hequet, Lubbock, TX (US);
Md Abu Sayeed, Lubbock, TX (US);
Zach Hinds, Lubbock, TX (US);
Texas Tech University System, Lubbock, TX (US);
Abstract
Disclosed is a system and method for extraction of information of within sample distribution of fiber quality from high-volume instrument (HVI) fibrogram to better predict yarn quality than the standard HVI output. The present invention allows for information on fiber quality to be obtained while avoiding testing samples with more expensive techniques. The disclosed system and method extracts HVI data for collecting a respective set of initial fibrograms from a set of fiber samples and representing them as a distance matrix to form a matrix of transformed fibrogram data, said matrix of transformed fibrogram data comprising a vector of scores to represent each sample and thereafter explaining variation in yarn quality by extracting all of the information available from the fibrogram.