The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Apr. 18, 2022
Applicant:

Saam, Inc., Indianapolis, IN (US);

Inventor:

John Coates, Newtown, CT (US);

Assignee:

SAAM, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/85 (2006.01); G01N 21/25 (2006.01); G01J 3/00 (2006.01); G01J 3/02 (2006.01); G01J 3/36 (2006.01); G01J 3/42 (2006.01); G01J 3/457 (2006.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
G01N 21/8507 (2013.01); G01J 3/00 (2013.01); G01J 3/0202 (2013.01); G01J 3/0205 (2013.01); G01J 3/0256 (2013.01); G01J 3/0291 (2013.01); G01J 3/36 (2013.01); G01J 3/42 (2013.01); G01J 3/457 (2013.01); G01N 21/255 (2013.01); G01N 21/359 (2013.01); G01N 21/85 (2013.01); G01N 2201/08 (2013.01);
Abstract

A remote sampling sensor for determining characteristics of a sample includes measurement optics and an insertion probe. The measurement optics are configured to emit light and detect returned light. The insertion probe includes a chamber, the chamber being configured to permit the sample to enter the chamber, an insertion tip at a distal end of the insertion probe, and a retro-reflective optic adjacent the insertion tip. The retro-reflective optic is configured to return the light from the measurement optics through the chamber to the measurement optics. The insertion probe is configured to be remotely located from the measurement optics.


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