The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Jun. 02, 2021
Applicants:
The University of Tokyo, Tokyo, JP;
Osaka University, Osaka, JP;
Inventors:
Assignees:
The University of Tokyo, Tokyo, JP;
Osaka University, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01); G01B 11/00 (2006.01); G01N 21/64 (2006.01); H03M 7/30 (2006.01); G01N 21/53 (2006.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 21/01 (2013.01); G01B 11/00 (2013.01); G01N 21/53 (2013.01); G01N 21/59 (2013.01); G01N 21/64 (2013.01); G01N 21/6456 (2013.01); H03M 7/3062 (2013.01);
Abstract
Any one or both of an optical system with a structured lighting pattern and a structured detecting system having a plurality of regions with different optical characteristics are used. In addition, optical signals from an object to be observed through one or a small number of pixel detectors are detected while changing relative positions between the object to be observed and any one of the optical system and the detecting system, time series signal information of the optical signals are obtained, and an image associated with an object to be observed from the time series signal information is reconstructed.