The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Nov. 14, 2018
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
Whether an internal defect is present in an inspection target is readily judged. Provided is an inspection method for an inspection target that is a layered structure including an FRP material and/or a structure made of resin, the method including the steps of: tapping, with a tapping tool, an inspection target area on a surface of the inspection target; detecting, by an accelerometer mounted to the tapping tool, an acceleration signal corresponding to acceleration of the tapping tool due to reaction force against the tapping; recording waveform data about the detected acceleration signal; creating a contour map corresponding to the inspection target area, based on the recorded waveform data; displaying the contour map on a display unit; and judging whether an internal defect is present in the inspection target, based on the contour map displayed on the display unit.