The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Jun. 16, 2020
Gautam Char, San Jose, CA (US);
Nick Doe, San Jose, CA (US);
Vishal Khosla, San Jose, CA (US);
Ming Chan, San Jose, CA (US);
Michael Vinogradov-nurenberg, San Jose, CA (US);
Jun Xiao, San Jose, CA (US);
Gautam Char, San Jose, CA (US);
Nick Doe, San Jose, CA (US);
Vishal Khosla, San Jose, CA (US);
Ming Chan, San Jose, CA (US);
Michael Vinogradov-Nurenberg, San Jose, CA (US);
Jun Xiao, San Jose, CA (US);
Other;
Abstract
A universal material tester with two or more consecutively arranges test units has a test tool supporting carriage, which is provided with a removable partition that allows conversion of the test-unit installation socket from a multiple test unit holder into a single test-unit holder, or vice versa. An advantage of the tester is a possibility of expanding dynamic range of measurements by using two or more test units, which are installed in series at one setting and can be used in sequential tests without replacement but with different measurement ranges. This broadens the dynamic measurement ranges and allows revealing material properties otherwise unattainable. The test units may be combined with an imaging device installed in series with the test tools that engage the sample physically.