The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Mar. 03, 2021
Applicant:

Airbus Sas, Blagnac, FR;

Inventor:

Mathias Farouz-Fouquet, Blagnac, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/22 (2006.01); B64D 47/00 (2006.01); G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
G01N 1/2252 (2013.01); B64D 47/00 (2013.01); G01N 15/02 (2013.01);
Abstract

The system, configured for being on board an aircraft, includes a probe for collecting samples of contrail, a chamber for collecting the samples, a collecting conduit for conducting the samples from the collecting probe the collecting chamber and at least one device for measuring at least one parameter characterizing the samples in the collecting conduit while they are conducted from the collecting probe to the collecting chamber. By virtue of the system, it is not necessary to use a second aircraft that follows the aircraft for collecting samples of contrail.


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Farouz-Fouquet, Mathias. (2023). System for sampling and analyzing contrails generated by an aircraft (U.S. Patent No. 11579050). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11579050

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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