The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Mar. 13, 2020
Applicant:

Formlabs, Inc., Somerville, MA (US);

Inventors:

Andrew M. Goldman, Stow, MA (US);

Henry Whitney, Weymouth, MA (US);

Justin Keenan, Lexington, MA (US);

Benjamin FrantzDale, Harvard, MA (US);

Michael Fogleman, Cary, NC (US);

Maxim Lobovsky, Cambridge, MA (US);

Assignee:

Formlabs, Inc., Somerville, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); G01M 11/02 (2006.01); B33Y 30/00 (2015.01); B33Y 50/00 (2015.01); B29C 64/386 (2017.01);
U.S. Cl.
CPC ...
G01M 11/0278 (2013.01); B29C 64/386 (2017.08); B33Y 30/00 (2014.12); B33Y 50/00 (2014.12);
Abstract

According to some aspects, calibration techniques are provided that allow an optics module of an additive fabrication device to be installed and operated in a stereolithography device by a user. In particular, the calibration techniques enable the optics module to be calibrated in a way that only depends on the characteristics of the optics module, and not upon any other components of the stereolithography device. As a result, the techniques enable a user of a stereolithography device to remove one optics module and replace it with another, without it being necessary to repair or replace the whole device. In some cases, the calibration techniques may include directing light onto one or more fiducial targets within the stereolithography device and measuring light scattered from said targets.


Find Patent Forward Citations

Loading…