The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Apr. 04, 2019
Fanuc Corporation, Yamanashi, JP;
Hiroshi Abe, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A measurement operation parameter adjustment apparatus that enables efficient measurement of the placement position of an object to be measured even in the case where there are variations in the placement positions, the sizes, and the product types of objects to be measured includes a machine learning device. The machine learning device observes measurement operation parameter data representing the measurement operation parameter of the measurement operation and measurement time data representing time taken to perform the measurement operation as a state variable representing a current environmental state and performs learning or decision-making using a learning model obtained by modeling adjustment of the measurement operation parameter based on the state variable.