The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Sep. 19, 2018
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Yuki Nishina, Ikoma, JP;

Yoshinori Konishi, Souraku-gun, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 13/08 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1612 (2013.01); B25J 9/1697 (2013.01); B25J 13/086 (2013.01); B25J 13/088 (2013.01);
Abstract

A gripping method relates to a method for gripping an object using a multi-fingered hand provided with a plurality of fingers. The method includes measuring, using a three-dimensional measurement sensor, an area that contains the object, and obtaining three-dimensional information for each position within the area, and deciding positions of the plurality of fingers for gripping the object, by classifying the area, if the area includes a measured area for which the three-dimensional information could be obtained and an unmeasured area for which the three-dimensional information could not be obtained, into the measured area and the unmeasured area based on the distance-indicating information, the positions of the plurality of fingers being decided based on positions of the unmeasured area.


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