The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Mar. 12, 2019
Massachusetts Institute of Technology, Cambridge, MA (US);
Emeric Plancher, Saint-Etienne, FR;
Cemal Cem Tasan, Cambridge, MA (US);
Nicolaas Hendrikus Vonk, Utrecht, NL;
Ke Qu, Lanzhou, CN;
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
Methods and devices are disclosed for tracking site-specific microstructure evolutions and local mechanical fields in metallic samples deformed along biaxial strain paths. The method is based on interrupted bulge tests carried out with a custom sample holder adapted for SEM-based analytical measurements. Embodiments include elliptical dies used to generate proportional and complex strain paths in material samples. One example holding device includes a base having a floor and walls that extend to form a chamber for a sample, the floor having apertures for receiving a pressure-supplying fluid, a cover having an opening and configured such that the cover and base can be coupled together to tightly clamp a sample in the chamber, and washers disposed between the base and the cover, each washer having openings extending therethrough change at least one of a shape and a size of the opening formed in the cover.