The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Aug. 15, 2019
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventor:
Takanori Yoshida, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 6/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
A61B 6/504 (2013.01); A61B 6/481 (2013.01); G06T 5/50 (2013.01); A61B 6/463 (2013.01); A61B 6/5235 (2013.01); A61B 6/582 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30104 (2013.01);
Abstract
An image synthesis unit of an X-ray imaging apparatus is configured to correct a synthesis target image or a transparent image based on movement information of a feature point and movement information of a pixel and generate a synthesized image by synthesizing a corrected synthesis target image and a transparent image or synthesizing a synthesis target image and a corrected transparent image.
Yoshida, Takanori. (2023). X-ray imaging apparatus and x-ray image processing method (U.S. Patent No. 11576638). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11576638
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile