The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
May. 06, 2020
Jovan G. Brankov, Evanston, IL (US);
Oriol Caudevilla Torras, Seattle, WA (US);
Wei Zhou, Aurora, IL (US);
Jovan G. Brankov, Evanston, IL (US);
Oriol Caudevilla Torras, Seattle, WA (US);
Wei Zhou, Aurora, IL (US);
ILLINOIS INSTITUTE OF TECHNOLOGY, Chicago, IL (US);
Abstract
A method and system for detecting an image of an object in an analyzer-based system with a polychromatic x-ray beam from an x-ray source, wherein an analyzer crystal and a detector simultaneously acquire a rocking curve of the x-ray beam for all energies of the x-ray beam. The x-ray beam is diffracted through the object using an asymmetrical monochromator. A detector movement is synchronized with one of the x-ray source or the object. The synchronization includes moving the detector at a first rate that is different than a second rate of the object or the x-ray source, wherein a ratio between the first rate and the second rate is determined by the magnification of the system.