The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Jun. 24, 2020
Applicant:

Case Western Reserve University, Cleveland, OH (US);

Inventors:

Steve J A Majerus, University Heights, OH (US);

Jeremy Dunning, Cleveland Heights, OH (US);

Katherine M. Bogie, Cleveland, OH (US);

Joseph A. Potkay, Plymouth, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G01L 9/04 (2006.01); A61B 5/024 (2006.01); A61B 5/021 (2006.01); A61B 5/026 (2006.01); G01L 9/00 (2006.01); G01L 9/06 (2006.01);
U.S. Cl.
CPC ...
A61B 5/683 (2013.01); A61B 5/026 (2013.01); A61B 5/02141 (2013.01); A61B 5/02444 (2013.01); A61B 5/6876 (2013.01); G01L 9/0052 (2013.01); G01L 9/06 (2013.01); A61B 2562/12 (2013.01);
Abstract

A sensor apparatus includes at least one substrate layer of an elastically deformable material, the substrate layer extending longitudinally between spaced apart ends thereof. A conductive layer is attached to and extends longitudinally between the spaced apart ends of the at least one substrate layer. The conductive layer includes an electrically conductive material adapted to form a strain gauge having an electrical resistance that varies based on deformation of the conductive layer in at least one direction.


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