The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Apr. 18, 2019
X Development Llc, Mountain View, CA (US);
Sarah Ann Laszlo, Mountain View, CA (US);
Nina Thigpen, Sunnyvale, CA (US);
Vladimir Miskovic, Binghamton, NY (US);
Yvonne Yip, San Francisco, CA (US);
X Development LLC, Mountain View, CA (US);
Abstract
Methods, systems, and computer programs encoded on a computer storage medium, for improving EEG measurements by identifying artifacts present in EEG measurements and providing a real-time indication to a user of likely artifacts in EEG measurements are described. EEG measurements of a patient can be obtained by placing a wearable device or EEG cap on a patient's head. Sensors in the cap provide EEG data to a computing device that processes the data to identify one or more artifacts in the EEG data. The artifacts can be identified by conducting one or more operations of determining the signal to noise ratio of the line noise, calculating mutual information between sensor pairs, and applying the p-welch method. Based on the types of artifacts identified, the computing device can output an indicator that provides feedback to the technician performing an EEG test to make adjustments to the test setup.