The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2023
Filed:
Jul. 31, 2019
Wonkwang University Center for Industry-academy Cooperation, Jeollabuk-do, KR;
Kwon Ha Yoon, Jeollabuk-do, KR;
Seung Jin Kim, Jeollanam-do, KR;
Ji Eon Kim, Jeju-do, KR;
Si Hyung No, Jeollabuk-do, KR;
Tae Hoon Kim, Jeollabuk-do, KR;
Chang Won Jeong, Jeollabuk-do, KR;
Wonkwang University Center for Industry-Academy Cooperation, Jeollabuk-Do, KR;
Abstract
An image analysis method for multicenter study includes, by a multicenter study support system, recruiting and selecting a plurality of agency systems to perform multicenter study, and then distributing an analysis guide and an analysis program corresponding to a purpose and condition of the multicenter study to each of the agency systems, by each of the agency systems, collecting analysis data acquired through the analysis guide and the analysis program and then uploading the analysis data to the multicenter study support system, and by the multicenter study support system, collecting and processing the uploaded analysis data, and then sharing the data processing result with each of the agency systems.