The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Feb. 07, 2022
Applicant:

Intelligent Virus Imaging Inc., Southern Pines, NC (US);

Inventor:

Martin Ryner, Huddinge, SE;

Assignee:

Intelligent Virus Imaging Inc., Southern Pines, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G06V 10/60 (2022.01); G06V 10/75 (2022.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G06V 20/695 (2022.01); G06V 10/60 (2022.01); G06V 10/751 (2022.01); G06V 20/69 (2022.01); G02B 21/361 (2013.01);
Abstract

The method is for dividing dark objects, substructures and background of an image from an electron microscope into segments by analyzing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.


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