The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Jan. 14, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Amit Jain, San Francisco, CA (US);

Aditya Sankar, Seattle, WA (US);

Qi Shan, Mercer Island, WA (US);

Alexandre Da Veiga, San Francisco, CA (US);

Shreyas V. Joshi, Seattle, WA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/64 (2022.01); G06K 9/62 (2022.01); G06T 7/60 (2017.01); G06V 10/22 (2022.01);
U.S. Cl.
CPC ...
G06V 20/64 (2022.01); G06K 9/6268 (2013.01); G06T 7/60 (2013.01); G06V 10/22 (2022.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Various implementations disclosed herein include devices, systems, and methods that obtain a three-dimensional (3D) representation of a physical environment that was generated based on depth data and light intensity image data, generate a 3D bounding box corresponding to an object in the physical environment based on the 3D representation, classify the object based on the 3D bounding box and the 3D semantic data, and display a measurement of the object, where the measurement of the object is determined using one of a plurality of class-specific neural networks selected based on the classifying of the object.


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