The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 07, 2023

Filed:

Mar. 10, 2021
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Biplob Debnath, Princeton, NJ (US);

Srimat Chakradhar, Manalapan, NJ (US);

M. Ashraf Siddiquee, Albuquerque, NM (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/74 (2022.01); G06F 16/783 (2019.01); G06F 16/78 (2019.01); G06V 20/40 (2022.01);
U.S. Cl.
CPC ...
G06V 10/761 (2022.01); G06F 16/7837 (2019.01); G06F 16/7867 (2019.01); G06V 20/46 (2022.01); G06V 20/44 (2022.01);
Abstract

Methods and systems for detecting and predicting anomalies include processing frames of a video stream to determine values of a feature corresponding to each frame. A feature time series is generated that corresponds to values of the identified feature over time. A matrix profile is generated that identifies similarities of sub-sequences of the time series to other sub-sequences of the feature time series. An anomaly is detected by determining that a value of the matrix profile exceeds a threshold value. An automatic action is performed responsive to the detected anomaly.


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