The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 07, 2023
Filed:
Jun. 16, 2021
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Derek T. Robison, Acton, MA (US);
Robin L. Brown, Leominster, MA (US);
Jason V. Irr, Tewksbury, MA (US);
Gregory W. Sletterink, Cambridge, MA (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
Local detail enhancement (LDE) is an imagery contrast enhancement method applied to visible and uncooled long wave imagery. It enhances local spatial detail through the use of a median based high/band pass filter. The generated detail channel is blended with a histogram-equalized version of the image, creating an image that contains both local detail as well as retaining some amount of global intensity. Retaining global intensity coherency allows for easier target acquisition when compared to fully local forms of contrast enhancement.